Tweak tests, consolidate pins target validation (#21254)

This commit is contained in:
Scott Lahteine
2021-03-05 04:30:52 -06:00
committed by GitHub
parent f56929d0df
commit 3ea56ba4c7
220 changed files with 631 additions and 509 deletions

View File

@ -0,0 +1,26 @@
#!/usr/bin/env bash
#
# Build tests for STM32F103RE BigTreeTech (SKR E3 DIP v1.0)
#
# exit on first failure
set -e
#
# Build with the default configurations
#
restore_configs
opt_set MOTHERBOARD BOARD_BTT_SKR_E3_DIP SERIAL_PORT 1 SERIAL_PORT_2 -1
exec_test $1 $2 "BigTreeTech SKR E3 DIP v1.0 - Basic Configuration" "$3"
restore_configs
opt_set MOTHERBOARD BOARD_BTT_SKR_CR6 SERIAL_PORT -1 SERIAL_PORT_2 2 TEMP_SENSOR_BED 1
opt_enable CR10_STOCKDISPLAY \
NOZZLE_AS_PROBE Z_MIN_PROBE_USES_Z_MIN_ENDSTOP_PIN Z_SAFE_HOMING \
PROBE_ACTIVATION_SWITCH PROBE_TARE PROBE_TARE_ONLY_WHILE_INACTIVE \
PROBING_HEATERS_OFF PREHEAT_BEFORE_PROBING
opt_disable NOZZLE_TO_PROBE_OFFSET
exec_test $1 $2 "BigTreeTech SKR CR6 PROBE_ACTIVATION_SWITCH, Probe Tare" "$3"
# clean up
restore_configs